Issued Patents All Time
Showing 176–190 of 190 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7459741 | Semiconductor memory device | Masaru Kidoh, Hideaki Aochi, Masaru Kito | 2008-12-02 |
| 7391068 | Semiconductor device | Masaru Kito, Hideaki Aochi, Nobutoshi Aoki, Masaki Kondo, Sanae Ito | 2008-06-24 |
| 7276750 | Semiconductor device having trench capacitor and fabrication method for the same | Masaru Kito, Masaru Kido, Hideaki Aochi, Toshiharu Tanaka, Hideki Inokuma +1 more | 2007-10-02 |
| 7145197 | Semiconductor device and method of manufacturing the same | Masaru Kidoh, Hideaki Aochi, Masaru Kito, Hitomi Yasutake | 2006-12-05 |
| 7141846 | Semiconductor storage device and method for manufacturing the same | — | 2006-11-28 |
| 7135368 | Semiconductor memory device with surface strap and method of fabricating the same | Masaru Kito, Hideaki Aochi | 2006-11-14 |
| 7019349 | Semiconductor memory device with cap structure and method of manufacturing the same | Hideaki Aochi | 2006-03-28 |
| 6998676 | Double-gate structure fin-type transistor | Masaki Kondo | 2006-02-14 |
| 6977404 | Trench DRAM with double-gated transistor and method of manufacturing the same | Hideaki Aochi | 2005-12-20 |
| 6933561 | Semiconductor device and method of manufacturing the same | Hideaki Aochi | 2005-08-23 |
| 6867450 | Semiconductor memory device with surface strap and method of fabricating the same | Masaru Kito, Hideaki Aochi | 2005-03-15 |
| 6724053 | PMOSFET device with localized nitrogen sidewall implantation | Rama Divakaruni, Giuseppe La Rosa, Rajesh Rengarajan, Mary E. Weybright | 2004-04-20 |
| 6268299 | Variable stoichiometry silicon nitride barrier films for tunable etch selectivity and enhanced hyrogen permeability | Rajarao Jammy, Johnathan E. Faltermeier, Keitaro Imai, Jean-Marc Rousseau, Viraj Y. Sardesai +1 more | 2001-07-31 |
| 5894278 | Shield plate, electronic appliance equipped with shield plate, remote control system for electronic appliance, and shielding apparatus | Satoko Kubo | 1999-04-13 |
| 5851842 | Measurement system and measurement method | Nobuo Hayasaka, Naoki Yasuda, Hideshi Miyajima, Iwao Higashikawa, Masaki Hotta | 1998-12-22 |