Issued Patents All Time
Showing 1–25 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12205272 | Pattern inspection device and pattern inspection method | — | 2025-01-21 |
| 11385192 | Inspection apparatus and inspection method | Masataka Shiratsuchi, Riki Ogawa | 2022-07-12 |
| 11101103 | Multiple electron beam inspection apparatus and multiple electron beam inspection method | Masataka Shiratsuchi, Riki Ogawa | 2021-08-24 |
| 10984978 | Multiple electron beam inspection apparatus and multiple electron beam inspection method | Ryoichi Hirano, Masataka Shiratsuchi, Riki Ogawa | 2021-04-20 |
| 10572995 | Inspection method and inspection apparatus | Nobutaka Kikuiri | 2020-02-25 |
| 10298000 | Door hole seal for automobile | Yasuhiro Itsuki, Naoya Sasaki, Satoshi Endo | 2019-05-21 |
| 10232689 | Vehicular door structure | Satoshi Endo | 2019-03-19 |
| 10197507 | Inspection apparatus | Riki Ogawa, Masatoshi Hirono | 2019-02-05 |
| 9841385 | Pattern characteristic-detection apparatus for photomask and pattern characteristic-detection method for photomask | Hiroyuki Ikeda, Eiji Sawa | 2017-12-12 |
| 9764625 | Vehicle door | Satoshi Endo | 2017-09-19 |
| 9691143 | Inspection apparatus and inspection apparatus system | Nobutaka Kikuiri | 2017-06-27 |
| 9645488 | Position measuring method, misplacement map generating method, and inspection system | — | 2017-05-09 |
| 9557277 | Inspection apparatus and inspection method | Riki Ogawa | 2017-01-31 |
| 9539884 | Door sash | Satoshi Endo | 2017-01-10 |
| 9460502 | Defect inspection apparatus using images obtained by optical path adjusted | Takeshi Fujiwara | 2016-10-04 |
| 9406117 | Inspection system and method for inspecting line width and/or positional errors of a pattern | Takanao Touya, Shuichi Tamamushi, Hidenori Sato, Hiroyuki Tanizaki, Takeshi Fujiwara +4 more | 2016-08-02 |
| 9290971 | Door device for vehicle | Toyohisa Amagai, Kinji Hoshikawa | 2016-03-22 |
| 9207189 | Sample support apparatus | Riki Ogawa | 2015-12-08 |
| 9194817 | Defect detection method | Shinji Sugihara, Riki Ogawa | 2015-11-24 |
| 9116136 | Inspection method and system | Nobutaka Kikuiri | 2015-08-25 |
| 9036896 | Inspection system and method for inspecting line width and/or positional errors of a pattern | Takanao Touya, Shuichi Tamamushi, Hidenori Sato, Hiroyuki Tanizaki, Takeshi Fujiwara +4 more | 2015-05-19 |
| 8761518 | Pattern inspection apparatus | Takeshi Fujiwara, Hiroshi Tsukada, Takashi Hirano | 2014-06-24 |
| 8358340 | Pattern inspection device and method of inspecting pattern | Ryoji Yoshikawa, Tomohide Watanabe, Hiroyuki Ikeda, Hiroyuki Tanizaki | 2013-01-22 |
| 7466854 | Size checking method and apparatus | Eiji Sawa | 2008-12-16 |
| 7394048 | Focusing device, focusing method and a pattern inspecting apparatus | Tomohide Watanabe, Satoshi Endo, Masami Ikeda | 2008-07-01 |