BJ

Blaine D. Johs

JC J.A. Woollam Co.: 96 patents #2 of 52Top 4%
UN University Of Nebraska: 3 patents #132 of 808Top 20%
📍 Lincoln, NE: #5 of 1,303 inventorsTop 1%
🗺 Nebraska: #13 of 5,697 inventorsTop 1%
Overall (All Time): #14,037 of 4,157,543Top 1%
102
Patents All Time

Issued Patents All Time

Showing 26–50 of 102 patents

Patent #TitleCo-InventorsDate
7492455 Discrete polarization state spectroscopic ellipsometer system and method of use Martin M. Liphardt, Ping He, Jeffrey S. Hale 2009-02-17
7483148 Ellipsometric investigation of very thin films 2009-01-27
7468794 Rotating compensator ellipsometer system with spatial filter equivalent Martin M. Liphardt, Craig M. Herzinger, Ping He 2008-12-23
7460230 Deviation angle self compensating substantially achromatic retarder Steven E. Green, Craig M. Herzinger, Duane E. Meyer 2008-12-02
7450231 Deviation angle self compensating substantially achromatic retarder Steven E. Green, Craig M. Herzinger, Duane E. Meyer 2008-11-11
7385697 Sample analysis methodology utilizing electromagnetic radiation John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki +3 more 2008-06-10
7362435 Method of determining initial thickness value for sample surface layer, and use of splines for fitting ellipsometric data Jeffrey S. Hale 2008-04-22
7349092 System for reducing stress induced effects during determination of fluid optical constants Thomas E. Tiwald, John A. Woollam, Galen L. Pfeiffer, Craig M. Herzinger 2008-03-25
7345762 Control of beam spot size in ellipsometer and the like systems Martin M. Liphardt, John A. Woollam, Duane E. Meyer, James D. Welch 2008-03-18
7336361 Spectroscopic ellipsometer and polarimeter systems Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more 2008-02-26
7327456 Spectrophotometer, ellipsometer, polarimeter and the like systems John A. Woollam, Steven E. Green, Ping He, Craig M. Herzinger, Galen L. Pfeiffer +3 more 2008-02-05
7317529 Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples Martin M. Liphardt, Ping He, Galen L. Pfeiffer, James D. Welch, John A. Woollam 2008-01-08
7307724 Method of reducing the effect of noise in determining the value of a dependent variable Martin M. Liphardt 2007-12-11
7304737 Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more 2007-12-04
7301631 Control of uncertain angle of incidence of beam from Arc lamp Ping He, Galen L. Pfeiffer, Steven E. Green, Christopher A. Goeden, Martin M. Liphardt 2007-11-27
7295313 Application of intermediate wavelength band spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters Jeffrey S. Hale, John A. Woollam, Craig M. Herzinger 2007-11-13
7283234 Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface John A. Woollam, Thomas E. Tiwald, Martin M. Liphardt, James D. Welch 2007-10-16
7277171 Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch 2007-10-02
7274450 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems Steven E. Green, Ping He, Galen L. Pfeiffer, Brian D. Guenther, Gerald T. Cooney +3 more 2007-09-25
7268876 General virtual interface algorithm for in-situ spectroscopic ellipsometric data analysis 2007-09-11
7265838 Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam, James D. Welch 2007-09-04
7245376 Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more 2007-07-17
7215424 Broadband ellipsometer or polarimeter system including at least one multiple element lens Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more 2007-05-08
7215423 Control of beam spot size in ellipsometer and the like systems Martin M. Liphardt, John A. Woollam, James D. Welch 2007-05-08
7193710 Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses Martin M. Liphardt, Jeffrey S. Hale, Craig M. Herzinger, Steven E. Green, Ping He +1 more 2007-03-20