Issued Patents All Time
Showing 1–25 of 79 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11081312 | Method of manufacturing emitter, emitter, and focused ion beam apparatus | Tomokazu Kozakai, Hiroyuki Mutoh, Yoko Nakajima, Hironori Moritani, Shinichi Matsubara | 2021-08-03 |
| 10971329 | Field ionization source, ion beam apparatus, and beam irradiation method | Shinichi Matsubara, Hiroyasu Shichi, Tomihiro Hashizume | 2021-04-06 |
| 10840070 | Ion beam device and cleaning method for gas field ion source | Atsushi Kobaru, Tomihiro Hashizume, Hiroyasu Shichi, Shinichi Matsubara | 2020-11-17 |
| 10790112 | Focused ion beam apparatus | — | 2020-09-29 |
| 10658143 | Method of manufacturing emitter | Yoko Nakajima, Hironori Moritani, Hiroshi Oba | 2020-05-19 |
| 10651006 | Ion beam apparatus | Shinichi Matsubara, Hiroyasu Shichi | 2020-05-12 |
| 10636623 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Hiroyuki Muto | 2020-04-28 |
| 10366858 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Hiroyuki Muto | 2019-07-30 |
| 10304656 | Ion beam device | Hiroyuki Muto | 2019-05-28 |
| 10211022 | Ion beam apparatus and ion beam irradiation method | Shinichi Matsubara, Hiroyasu Shichi, Tomihiro Hashizume | 2019-02-19 |
| 10163602 | Ion beam system | Hiroyasu Shichi, Shinichi Matsubara | 2018-12-25 |
| 9761407 | Ion beam device and emitter tip adjustment method | Hiroyuki Muto, Hiroyasu Shichi, Shinichi Matsubara | 2017-09-12 |
| 9640360 | Ion source and ion beam device using same | Hiroyasu Shichi, Shinichi Matsubara, Yoichi Ose, Noriaki Arai | 2017-05-02 |
| 9196453 | Gas field ionization ion source and ion beam device | Tohru Ishitani | 2015-11-24 |
| 9111716 | Charged particle microscope | Shinichi Matsubara, Hiroyuki Tanaka, Hiroyasu Shichi, Yoichi Ose | 2015-08-18 |
| 9087675 | Emitter, gas field ion source, and ion beam device | Hironori Moritani, Hiroyuki Muto | 2015-07-21 |
| 9058959 | Scanning ion microscope and secondary particle control method | Yoichi Ose | 2015-06-16 |
| 9018597 | Gas field ionization ion source and ion beam apparatus | Hironori Moritani | 2015-04-28 |
| 8981315 | Ion beam device having gas introduction port disposed on structure maintained at ground potential | Hiroyuki Muto | 2015-03-17 |
| 8847173 | Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same | Shinichi Matsubara, Hironori Moritani, Noriaki Arai, Hiroyasu Shichi, Tomihiro Hashizume +4 more | 2014-09-30 |
| 8809801 | Gas field ionization ion source and ion beam device | Tohru Ishitani | 2014-08-19 |
| 8569719 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Kaoru Umemura, Yuichi Madokoro, Yasunori Doi | 2013-10-29 |
| RE44445 | Method for forming partitions of plasma display panel by using sandblasting processing | Akihiro Fujinaga, Kazunori Ishizuka, Tatsutoshi Kanae, Kazuhide Iwasaki, Toshiyuki Nanto +5 more | 2013-08-20 |
| 8405053 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Kaoru Umemura, Yuichi Madokoro, Yasunori Doi | 2013-03-26 |
| 7999240 | Method and apparatus for specimen fabrication | Satoshi Tomimatsu, Kaoru Umemura, Yuichi Madokoro, Yasunori Doi | 2011-08-16 |