Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11721517 | Focused ion beam processing apparatus | Yasuhiko Sugiyama, Yoshitomo Nakagawa, Koji Nagahara | 2023-08-08 |
| 11017982 | Composite charged particle beam apparatus and control method thereof | Yasuhiko Sugiyama, Naoko Hirose | 2021-05-25 |
| 11017988 | Charged particle beam apparatus | Yasuhiko Sugiyama, Yasutaka Otsuka | 2021-05-25 |
| 10658143 | Method of manufacturing emitter | Yoko Nakajima, Yoshimi Kawanami, Hironori Moritani | 2020-05-19 |
| 10176964 | Focused ion beam apparatus | Yasuhiko Sugiyama | 2019-01-08 |
| 10056232 | Charged particle beam apparatus and plasma ignition method | Yasuhiko Sugiyama | 2018-08-21 |
| 9793085 | Focused ion beam apparatus | Anto Yasaka, Tomokazu Kozakai, Osamu Matsuda, Yasuhiko Sugiyama, Kazuo Aita +1 more | 2017-10-17 |
| 9773637 | Plasma ion source and charged particle beam apparatus | Yasuhiko Sugiyama, Mamoru Okabe | 2017-09-26 |
| 9773634 | Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus | Tomokazu Kozakai, Osamu Matsuda, Yasuhiko Sugiyama, Kazuo Aita, Fumio Aramaki +1 more | 2017-09-26 |
| 9773646 | Plasma ion source and charged particle beam apparatus | Yasuhiko Sugiyama, Mamoru Okabe | 2017-09-26 |
| 9640361 | Emitter structure, gas ion source and focused ion beam system | Anto Yasaka, Yasuhiko Sugiyama | 2017-05-02 |
| 9583299 | Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus | Tomokazu Kozakai, Osamu Matsuda, Yasuhiko Sugiyama, Kazuo Aita, Fumio Aramaki +1 more | 2017-02-28 |
| 9418817 | Focused ion beam apparatus and control method thereof | Fumio Aramaki, Yasuhiko Sugiyama | 2016-08-16 |
| 9378858 | Repair apparatus | Fumio Aramaki, Anto Yasaka, Osamu Matsuda, Yasuhiko Sugiyama, Tomokazu Kozakai +1 more | 2016-06-28 |
| 9129771 | Emitter structure, gas ion source and focused ion beam system | Anto Yasaka, Yasuhiko Sugiyama | 2015-09-08 |
| 9111717 | Ion beam apparatus | Tatsuya Asahata, Yasuhiko Sugiyama | 2015-08-18 |
| 8822911 | Focused ion beam apparatus and method of adjusting ion beam optics | Yasuhiko Sugiyama, Tatsuya Asahata, Toshio Doi | 2014-09-02 |
| 8460842 | Defect repair apparatus and method for EUV mask using a hydrogen ion beam | Takashi Ogawa, Fumio Aramaki, Anto Yasaka | 2013-06-11 |
| 5665182 | High-carbon steel wire rod and wire excellent in drawability and methods of producing the same | Akifumi Kawana, Ikuo Ochiai, Seiki Nishida | 1997-09-09 |
| 5662747 | Bainite wire rod and wire for drawing and methods of producing the same | Akifumi Kawana, Ikuo Ochiai, Seiki Nishida | 1997-09-02 |
| 5658399 | Bainite wire rod and wire for drawing and methods of producing the same | Akifumi Kawana, Ikuo Ochiai, Seiki Nishida | 1997-08-19 |
| 5658402 | High-carbon steel wire rod and wire excellent in drawability and methods of producing the same | Akifumi Kawana, Ikuo Ochiai, Seiki Nishida | 1997-08-19 |
| 5650027 | High-carbon steel wire rod and wire excellent in drawability and methods of producing the same | Akifumi Kawana, Ikuo Ochiai, Seiki Nishida | 1997-07-22 |
| 5647918 | Bainite wire rod and wire for drawing and methods of producing the same | Akifumi Kawana, Ikuo Ochiai, Seiki Nishida | 1997-07-15 |
| 5280212 | Brush assembly for use with a direct current machine | — | 1994-01-18 |