Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12100585 | Energy spectrometer with dynamic focus | Arthur Reinout Hartong, Alexander Henstra, Peter Christiaan Tiemeijer | 2024-09-24 |
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Stephan Kujawa, Maarten Kuijper, Gerard Nicolaas Anne van Veen, Peter Christiaan Tiemeijer +1 more | 2020-11-10 |
| 9991087 | Spectroscopy in a transmission charged-particle microscope | Erwin de Jong, Peter Christiaan Tiemeijer, Rudolf Geurink | 2018-06-05 |
| 9524851 | Method of performing spectroscopy in a transmission charged-particle microscope | Erwin de Jong, Peter Christiaan Tiemeijer, Rudolf Geurink | 2016-12-20 |
| 9312098 | Method of examining a sample in a charged-particle microscope | Ivan Lazic, Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Bart Buijsse, Kasim Sader | 2016-04-12 |
| 8859966 | Simultaneous electron detection | Peter Christiaan Tiemeijer, Bert Henning Freitag | 2014-10-14 |
| 8405027 | Contrast for scanning confocal electron microscope | Bert Henning Freitag, Peter Christiaan Tiemeijer | 2013-03-26 |