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Ankan Pramanick, Mark Elston, Leon Chen |
2008-10-14 |
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Event based IC test system |
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2006-08-08 |
| 6771062 |
Apparatus for supporting and manipulating a testhead in an automatic test equipment system |
Niels Markert, Anthony Le |
2004-08-03 |
| 6747447 |
Locking apparatus and loadboard assembly |
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2004-06-08 |
| 6710590 |
Test head Hifix for semiconductor device testing apparatus |
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2004-03-23 |
| 5951704 |
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Kiyoshi Fukushima, Hiroaki Yamoto |
1999-09-14 |
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Semiconductor test system |
Jun Makino, Hiroaki Yamoto |
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