Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8254767 | Method and apparatus for extended temperature pyrometry | Aaron Muir Hunter, Jiping Li, Thomas Haw | 2012-08-28 |
| 8232503 | Pyrometer for laser annealing system | Jiping Li, Bruce E. Adams, Timothy N. Thomas, Aaron Muir Hunter, Abhilash J. Mayur | 2012-07-31 |
| 8222574 | Temperature measurement and control of wafer support in thermal processing chamber | Khurshed Sorabji, Alexander Lerner, Joseph M. Ranish, Aaron Muir Hunter, Bruce E. Adams +1 more | 2012-07-17 |
| 7860379 | Temperature measurement and control of wafer support in thermal processing chamber | Aaron Muir Hunter, Bruce E. Adams, Mehran Behdjat, Joseph M. Ranish | 2010-12-28 |
| 7804042 | Pryometer for laser annealing system compatible with amorphous carbon optical absorber layer | Jiping Li, Bruce E. Adams, Timothy N. Thomas, Aaron Muir Hunter, Abhilash J. Mayur | 2010-09-28 |
| 7112763 | Method and apparatus for low temperature pyrometry useful for thermally processing silicon wafers | Aaron Muir Hunter, Balasubramanian Ramachandran, Corina E. Tanasa, Tarpan Dixit | 2006-09-26 |