Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7198962 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2007-04-03 |
| 7119362 | Method of manufacturing semiconductor apparatus | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2006-10-10 |
| 6864695 | Semiconductor device testing apparatus and semiconductor device manufacturing method using it | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hiroya Shimizu | 2005-03-08 |
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno, Hiroya Shimizu +1 more | 2004-12-07 |
| 6774654 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more | 2004-08-10 |
| 6714030 | Semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2004-03-30 |
| 6696849 | Fabrication method of semiconductor integrated circuit device and its testing apparatus | Masaaki Namba, Akio Hasebe, Yuji Wada, Ryuji Kohno, Akira Seito +1 more | 2004-02-24 |
| 6573112 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2003-06-03 |
| 6566149 | Method for manufacturing substrate for inspecting semiconductor device | Masatoshi Kanamaru, Atsushi Hosogane, Yoshihige Endou, Ryuji Kouno, Hideo Miura +4 more | 2003-05-20 |
| 6566150 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2003-05-20 |
| 6548315 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2003-04-15 |
| 6511857 | Process for manufacturing semiconductor device | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2003-01-28 |
| 6496023 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Toshio Miyatake +1 more | 2002-12-17 |
| 6479305 | Semiconductor device manufacturing method | Ryuji Kono, Akihiko Ariga, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo +4 more | 2002-11-12 |
| 6455335 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2002-09-24 |
| 6358762 | Manufacture method for semiconductor inspection apparatus | Ryuji Kohno, Hideo Miura, Yoshishige Endo, Masatoshi Kanamaru, Atsushi Hosogane +1 more | 2002-03-19 |
| 6197603 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2001-03-06 |
| 5532909 | Reflector for a vehicular lamp and method of producing a die therefor | Hiroshi Kawashima | 1996-07-02 |