Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11143606 | Particle measuring device and particle measuring method | Tomihiro Hashizume, Tsunenori Nomaguchi, Takafumi Miwa | 2021-10-12 |
| 10697767 | Sample for measuring particles, method for measuring particles and apparatus for measuring particles | Tomihiro Hashizume, Sanato NAGATA | 2020-06-30 |
| 8657962 | Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus | Hiroki Hayashi, Takashi Konno, Kouji Iwasaki, Junichi Tashiro | 2014-02-25 |
| 8601609 | Friction force microscope | Masafumi Watanabe | 2013-12-03 |
| 8111079 | Conductivity measuring apparatus and conductivity measuring method | Takakazu Fukuchi | 2012-02-07 |
| 8062494 | Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method | Futoshi Iwata, Takuya Nakaue, Syuichi Kikuchi, Osamu Takaoka | 2011-11-22 |
| 8028567 | AFM tweezers, method for producing AFM tweezers, and scanning probe microscope | Tatsuya Kobayashi, Masato Suzuki, Takeshi Umemoto | 2011-10-04 |
| 8001831 | Positioning apparatus and scanning probe microscope employing the same | Masafumi Watanabe | 2011-08-23 |
| 7987703 | Tweezer-equipped scanning probe microscope and transfer method | Takashi Konno | 2011-08-02 |
| 7926328 | Sample manipulating apparatus | Takeshi Umemoto, Masafumi Watanabe | 2011-04-19 |
| 7866205 | Sample operation apparatus | Takeshi Umemoto | 2011-01-11 |
| 7770474 | Sample operation apparatus | Takeshi Umemoto | 2010-08-10 |
| 7507957 | Probe microscope system suitable for observing sample of long body | Masamichi Fujihira, Tatsuaki Ataka | 2009-03-24 |
| 7495215 | Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes | Hiroyuki Akinaga, Yasuyuki Semba, Hiroshi Yokoyama, Hiromi Kuramochi | 2009-02-24 |
| 7476418 | Method for fabricating nanometer-scale structure | Takashi Kaito, Yoshiharu Shirakawabe, Itaru Kitajima | 2009-01-13 |
| 7442925 | Working method using scanning probe | Takuya Nakaue, Kazutoshi Watanabe, Osamu Takaoka, Atsushi Uemoto, Naoya Watanabe +1 more | 2008-10-28 |
| 7398678 | Probe for a scanning microscope | Yoshikazu Nakayama, Takashi Okawa, Shigenobu Yamanaka, Akio Harada, Yoshiharu Shirakawabe | 2008-07-15 |
| 7378654 | Processing probe | Shigeru Wakiyama, Osamu Takaoka | 2008-05-27 |
| 7373806 | Scanning probe microscope and scanning method | Itaru Kitajima, Kazutoshi Watanabe, Shigeru Wakiyama, Akira Inoue | 2008-05-20 |
| 7278299 | Method of processing vertical cross-section using atomic force microscope | Osamu Takaoka, Shigeru Wakiyama, Naoya Watanabe | 2007-10-09 |
| 7259372 | Processing method using probe of scanning probe microscope | Osamu Takaoka, Shigeru Wakiyama, Naoya Watanabe | 2007-08-21 |
| 7232995 | Method of removing particle of photomask using atomic force microscope | Osamu Takaoka, Shigeru Wakiyama, Naoya Watanabe | 2007-06-19 |
| 6864481 | Probe for scanning probe microscope | Takashi Kaito, Tatsuya Adachi | 2005-03-08 |
| 6817231 | Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof | Hiroyuki Akinaga, Hiroshi Yokoyama | 2004-11-16 |
| 6787769 | Conductive probe for scanning microscope and machining method using the same | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-09-07 |