TU

Takeshi Umemoto

NE Nec: 7 patents #2,006 of 14,502Top 15%
Sharp Kabushiki Kaisha: 5 patents #3,007 of 10,731Top 30%
SN Sii Nanotechnology: 5 patents #29 of 157Top 20%
Yamaha Motor: 4 patents #461 of 2,310Top 20%
SI Seiko Instruments: 3 patents #474 of 1,437Top 35%
PA Panasonic: 1 patents #13,264 of 21,108Top 65%
FL Fujitsu General Limited: 1 patents #189 of 325Top 60%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
HS Hitachi High-Tech Science: 1 patents #94 of 167Top 60%
AC Aoi Electronics Co.: 1 patents #21 of 47Top 45%
Overall (All Time): #135,609 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 1–25 of 28 patents

Patent #TitleCo-InventorsDate
12405585 Air conditioning system including a platform with remote access to a main body of an air conditioning apparatus and including multiple function layers Sumie Morita, Tamotsu Nakajima, Masanori Tomita 2025-09-02
D984319 Motorcycle Yasuhiro Seki 2023-04-25
11598737 Analyzing apparatus and analyzing method Shinya Nishimura, Susumu Ito, Nobuaki Okubo 2023-03-07
D805000 Four wheeled vehicle 2017-12-12
9572082 Method for digital communication, radio communication system, and radio communication apparatus Yun Wen 2017-02-14
D774957 All-terrain vehicle 2016-12-27
D761698 Four wheeled vehicle 2016-07-19
9015444 Access apparatus and available storage space calculation method Takuji Maeda, Tsutomu Mori, Masafumi Nosaka 2015-04-21
8028567 AFM tweezers, method for producing AFM tweezers, and scanning probe microscope Tatsuya Kobayashi, Masato Suzuki, Masatoshi Yasutake 2011-10-04
7926328 Sample manipulating apparatus Masatoshi Yasutake, Masafumi Watanabe 2011-04-19
7873432 Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis Nobuyuki Ohminami, Masaru Tanaka 2011-01-18
7874016 Scanning probe microscope and scanning method Norio Ookubo 2011-01-18
7866205 Sample operation apparatus Masatoshi Yasutake 2011-01-11
7770474 Sample operation apparatus Masatoshi Yasutake 2010-08-10
7515258 Semiconductor device, and method and apparatus for inspecting appearance thereof Nobuyuki Ohminami 2009-04-07
6848454 Method of manufacturing semiconductor device Kazuhiro Hirohama 2005-02-01
6765283 Semiconductor device with multi-layer interlayer dielectric film 2004-07-20
6337270 Process for manufacturing semiconductor device 2002-01-08
6319753 Semiconductor device having lead terminals bent in J-shape Seiji Ichikawa, Toshiaki Nishibe, Kazunari Sato, Kunihiko Tsubota, Masato Suga +5 more 2001-11-20
6291822 Scanning probe microscope Yukihiro Sato, Masatoshi Yasutake 2001-09-18
6242797 Semiconductor device having pellet mounted on radiating plate thereof Seiji Ichikawa, Toshiaki Nishibe, Kazunari Sato, Kunihiko Tsubota, Masato Suga +5 more 2001-06-05
6242736 Scanning probe microscope Akihiko Honma, Akira Inoue 2001-06-05
6177720 Method of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frame Seiji Ichikawa, Toshiaki Nishibe, Kazunari Sato, Kunihiko Tsubota, Masato Suga +5 more 2001-01-23
6175150 Plastic-encapsulated semiconductor device and fabrication method thereof Seiji Ichikawa, Toshiaki Nishibe, Kazunari Sato, Kunihiko Tubota, Masato Suga +5 more 2001-01-16
6165818 Method of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frame Seiji Ichikawa, Toshiaki Nishibe, Kazunari Sato, Kunihiko Tsubota, Masato Suga +5 more 2000-12-26