Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7873432 | Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis | Masaru Tanaka, Takeshi Umemoto | 2011-01-18 |
| 7515258 | Semiconductor device, and method and apparatus for inspecting appearance thereof | Takeshi Umemoto | 2009-04-07 |
| 7278587 | Thermal treatment apparatus and thermal treatment method | — | 2007-10-09 |
| 6975102 | Apparatus and method for analyzing capacitance of insulator | — | 2005-12-13 |