AH

Akihiko Honma

SI Seiko Instruments: 3 patents #474 of 1,437Top 35%
SN Sii Nanotechnology: 3 patents #49 of 157Top 35%
Overall (All Time): #875,718 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
7066015 Scanning probe microscope 2006-06-27
6904791 Scanning probe microscope 2005-06-14
6734426 Probe scanning device Ryuichi Matsuzaki, Yukihiro Sato 2004-05-11
6242736 Scanning probe microscope Takeshi Umemoto, Akira Inoue 2001-06-05
5955660 Method of controlling probe microscope 1999-09-21
5506400 Scanning type probe microscope Kazutoshi Watanabe 1996-04-09