RM

Ryuichi Matsuzaki

SK Seiko Seiki Kabushiki Kaisha: 4 patents #10 of 125Top 8%
SI Seiko Instruments: 3 patents #474 of 1,437Top 35%
SN Sii Nanotechnology: 1 patents #82 of 157Top 55%
IBM: 1 patents #44,794 of 70,183Top 65%
Overall (All Time): #662,889 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
6734426 Probe scanning device Akihiko Honma, Yukihiro Sato 2004-05-11
6661006 Scanning probe instrument Yukihiro Sato 2003-12-09
6499340 Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope Masatoshi Yasutake, Akira Inoue, Akihiko Homma, Gerd Binnig, Walter Haeberle 2002-12-31
5983713 Scanning probe microscope 1999-11-16
5820104 Vertical transfer system for a vacuum chamber and gate valve assembly Shinji Koyano 1998-10-13
5280395 Hard disc track defect detecting apparatus 1994-01-18
5060091 Apparatus and method for hard disk testing 1991-10-22
5032932 Hard disk testing method Toshiharu Kogure, Yoshitake UESHIMA 1991-07-16