Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8765496 | Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis | Mehran Nasser-Ghodsi, Dave Bakker, Mehdi Vaez-Iravani, Prashant Aji, Rudy F. Garcia +1 more | 2014-07-01 |
| 7488938 | Charge-control method and apparatus for electron beam imaging | Alexander Jozef Gubbens, Ye Yang | 2009-02-10 |
| 7365321 | Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis | Mehran Nasser-Ghodsi | 2008-04-29 |
| 7304302 | Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysis | Peter Nunan, Muhran Nasser-Ghodsi, Rudy F. Garcia, Tzu-Chin Chuang, Herschel M. Marchman +1 more | 2007-12-04 |