| 12360461 |
Identification of hot spots or defects by machine learning |
Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen +1 more |
2025-07-15 |
| 12353837 |
Customizable framework for natural language processing explainability |
Haibo Ding, Rishita Rajal Anubhai, Muhammad Bilal Zafar, Huzefa Rangwala |
2025-07-08 |
| 12229945 |
Wafer bin map based root cause analysis |
Tomonori Honda, Richard Burch, Qing Zhu, Jeffrey Drue David, Michael Keleher |
2025-02-18 |
| 12124440 |
Converting natural language queries to SQL queries using ontological codes and placeholders |
Miguel Romero Calvo, Tesfagabir Meharizghi, Thiruvarul Selvan Senthivel, Saman Sarraf |
2024-10-22 |
| 12038802 |
Collaborative learning model for semiconductor applications |
Tomonori Honda, Richard Burch, John Kibarian, Qing Zhu, Vaishnavi Reddipalli +6 more |
2024-07-16 |
| 11775714 |
Rational decision-making tool for semiconductor processes |
Tomonori Honda, Lakshmikar Kuravi, Bogdan Cirlig |
2023-10-03 |
| 11763446 |
Wafer bin map based root cause analysis |
Tomonori Honda, Richard Burch, Qing Zhu, Jeffrey Drue David, Michael Keleher |
2023-09-19 |
| 11609812 |
Anomalous equipment trace detection and classification |
Richard Burch, Jeffrey Drue David, Qing Zhu, Tomonori Honda |
2023-03-21 |
| 11443083 |
Identification of hot spots or defects by machine learning |
Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen +1 more |
2022-09-13 |
| 11403453 |
Defect prediction |
Bruno La Fontaine, Marc Jurian Kea, Yasri Yudhistira, Maxime Philippe Frederic Genin |
2022-08-02 |
| 11295993 |
Maintenance scheduling for semiconductor manufacturing equipment |
Tomonori Honda, Jeffrey Drue David |
2022-04-05 |
| 11126092 |
Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target value |
Wenjin Huang, Bruno La Fontaine |
2021-09-21 |
| 11029359 |
Failure detection and classsification using sensor data and/or measurement data |
Tomonori Honda, Lakshmikar Kuravi |
2021-06-08 |
| 11022642 |
Semiconductor yield prediction |
Jeffrey Drue David, Tomonori Honda |
2021-06-01 |
| 10777470 |
Selective inclusion/exclusion of semiconductor chips in accelerated failure tests |
Tomonori Honda, Rohan D. Kekatpure, Lakshmikar Kuravi, Jeffrey Drue David |
2020-09-15 |