Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11694009 | Pattern centric process control | Chenmin Hu, Ye Chen, Yue Ma, Rong Lv, Justin Chen +3 more | 2023-07-04 |
| 10997340 | Pattern centric process control | Chenmin Hu, Ye Chen, Yue Ma, Rong Lv, Justin Chen +3 more | 2021-05-04 |
| 10546085 | Pattern centric process control | Chenmin Hu, Ye Chen, Yue Ma, Rong Lv, Justin Chen +3 more | 2020-01-28 |
| 10062160 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen +3 more | 2018-08-28 |
| 9846934 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Chenmin Hu, Ye Chen, Yue Ma, Chingyun Hsiang, Justin Chen +3 more | 2017-12-19 |
| 9401014 | Methods and systems for utilizing design data in combination with inspection data | Sagar A. Kekare, Ellis Chang, Allen Park, Peter Rose | 2016-07-26 |
| 9087367 | Determining design coordinates for wafer defects | Ellis Chang, Michael J. Van Riet, Allen Park, Santosh Bhattacharyya | 2015-07-21 |
| 8989479 | Region based virtual fourier filter | Lisheng Gao, Kenong Wu, Allen Park, Ellis Chang, Junqing Huang +5 more | 2015-03-24 |
| 8923600 | Methods and systems for utilizing design data in combination with inspection data | Sagar A. Kekare, Ellis Chang, Allen Park, Peter Rose | 2014-12-30 |
| 7570796 | Methods and systems for utilizing design data in combination with inspection data | Sagar A. Kekare, Ellis Chang, Allen Park, Peter Rose | 2009-08-04 |