Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10062160 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Justin Chen +3 more | 2018-08-28 |
| 9846934 | Pattern weakness and strength detection and tracking during a semiconductor device fabrication process | Khurram Zafar, Chenmin Hu, Ye Chen, Yue Ma, Justin Chen +3 more | 2017-12-19 |