Issued Patents All Time
Showing 25 most recent of 68 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8039813 | Charged particle-optical systems, methods and components | Antonio Casares, Thomas Kemen, Rainer Knippelmeyer, Thomas Bayer, Georg Fritz +1 more | 2011-10-18 |
| 6356089 | Contact probe arrangement | Thomas Bayer, Klaus Meissner, Werner Steiner, Roland Stoehr | 2002-03-12 |
| 6218264 | Method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer range | Johann W. Bartha, Thomas Bayer, Martin Nonnenmacher, deceased, Helga Weiss | 2001-04-17 |
| 6091124 | Micromechanical sensor for AFM/STM profilometry | Thomas Bayer, Helga Weiss | 2000-07-18 |
| 6087199 | Method for fabricating a very dense chip package | H. Bernhard Pogge, Bijan Davari, Howard L. Kalter | 2000-07-11 |
| 6088320 | Micro-mechanically fabricated read/write head with a strengthening shell on the tip shaft | Thomas Bayer, Helga Weiss | 2000-07-11 |
| 6061074 | Ion generator for ionographic print heads | Johann W. Bartha, Frank Druschke, Gerhard Elsner | 2000-05-09 |
| 6028008 | Calibration standard for profilometers and manufacturing procedure | Thomas Bayer, Klaus Meissner | 2000-02-22 |
| 6004700 | Membrane mask for electron beam lithography | Samuel Kalt, Klaus Meissner, Rudolf Paul | 1999-12-21 |
| 5998868 | Very dense chip package | H. Bernhard Pogge, Bijan Davari, Howard L. Kalter | 1999-12-07 |
| 5960255 | Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it | Johann W. Bartha, Thomas Bayer, Martin Nonnenmacher, deceased, Helga Weiss | 1999-09-28 |
| 5939893 | Contact probe arrangement for functional electrical testing | Gerhard Elsner, Roland Stoehr | 1999-08-17 |
| 5935739 | Manufacturing method for membrane lithography mask with mask fields | Thomas Bayer, Samuel Kalt, Klaus Meissner, Hans C. Pfeiffer | 1999-08-10 |
| 5866443 | Very dense integrated circuit package and method for forming the same | H. Bernhard Pogge, Howard L. Kalter, Raymond J. Rosner | 1999-02-02 |
| 5863636 | Adhesive bond for densely ordered elements | Frank Druschke, Gerhard Elsner, Roland Stoehr | 1999-01-26 |
| 5817581 | Process for the creation of a thermal SiO.sub.2 layer with extremely uniform layer thickness | Thomas Bayer, Klaus Meissner | 1998-10-06 |
| 5817201 | Method of fabricating a field emission device | Peter Pleshko, Gerhard Schmid | 1998-10-06 |
| 5814885 | Very dense integrated circuit package | H. Bernhard Pogge, Howard L. Kalter | 1998-09-29 |
| 5791959 | Method of fabricating a field emission device | Johann W. Bartha, Volkhard Wolf | 1998-08-11 |
| 5789666 | Resonant sensor for determining multiple physical values | Thomas Bayer, Gerhard Schmid, Volker Wolf | 1998-08-04 |
| 5783905 | Field emission device with series resistor tip and method of manufacturing | Peter Pleshko, Gerhard Schmid | 1998-07-21 |
| 5770884 | Very dense integrated circuit package | H. Bernhard Pogge, Howard L. Kalter, Raymond J. Rosner | 1998-06-23 |
| 5717278 | Field emission device and method for fabricating it | Johann W. Bartha, Volkhard Wolf | 1998-02-10 |
| 5707537 | Bulk removal, transport and storage fixture for small batch-fabricated devices | Johann W. Bartha, Klaus Meissner, Volkhard Wolf | 1998-01-13 |
| 5665905 | Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it | Johann W. Bartha, Thomas Bayer, Martin Nonnenmacher, deceased, Helga Weiss | 1997-09-09 |