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Reduced process sensitivity of electrode-semiconductor rectifiers |
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2013-07-23 |
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Semiconductor devices with stable and controlled avalanche characteristics and methods of fabricating the same |
Joseph A. Yedinak, Mark L. Rinehimer, Thomas E. Grebs |
2012-07-24 |
| 8148749 |
Trench-shielded semiconductor device |
Thomas E. Grebs, Mark L. Rinehimer, Joseph A. Yedinak, Dean E. Probst, Gary M. Dolny |
2012-04-03 |
| 8049276 |
Reduced process sensitivity of electrode-semiconductor rectifiers |
Joseph A. Yedinak, Mark L. Rinehimer, Thomas E. Grebs |
2011-11-01 |
| 7332750 |
Power semiconductor device with improved unclamped inductive switching capability and process for forming same |
Jifa Hao, Randall L. Case, Jae Jun YUN |
2008-02-19 |
| 6465325 |
Process for depositing and planarizing BPSG for dense trench MOSFET application |
Rodney S. Ridley, Frank Stensney, Jack H. Linn |
2002-10-15 |
| 6358825 |
Process for controlling lifetime in a P-I-N diode and for forming diode with improved lifetime control |
Jifa Hao, Randall L. Case |
2002-03-19 |
| 6080614 |
Method of making a MOS-gated semiconductor device with a single diffusion |
John Manning Savidge Neilson, Linda S. Brush, Frank Stensney, Anup Bhalla, Christopher L. Rexer +4 more |
2000-06-27 |
| 6054369 |
Lifetime control for semiconductor devices |
John Manning Savidge Neilson, Maxime Zafrani |
2000-04-25 |
| 5877044 |
Method of making MOS-gated semiconductor devices |
John Manning Savidge Neilson, Christopher Boguslaw Kocon, Richard Stokes, Linda S. Brush, Louise Skurkey +1 more |
1999-03-02 |
| 4778776 |
Passivation with a low oxygen interface |
David W. Tong, William R. VanDell |
1988-10-18 |
| 4597822 |
Method for making silicon wafers |
William R. Van Dell |
1986-07-01 |
