| 9537001 |
Reduction of degradation due to hot carrier injection |
Daniel Hahn |
2017-01-03 |
| 8872278 |
Integrated gate runner and field implant termination for trench devices |
Gary M. Dolny, Mark Rioux |
2014-10-28 |
| 8357562 |
Method to improve the reliability of the breakdown voltage in high voltage devices |
— |
2013-01-22 |
| 8269277 |
RESURF device including increased breakdown voltage |
— |
2012-09-18 |
| 7897471 |
Method and apparatus to improve the reliability of the breakdown voltage in high voltage devices |
— |
2011-03-01 |
| 7436021 |
Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing |
Rodney S. Ridley, Gary M. Dolny |
2008-10-14 |
| 7332750 |
Power semiconductor device with improved unclamped inductive switching capability and process for forming same |
John L. Benjamin, Randall L. Case, Jae Jun YUN |
2008-02-19 |
| 6635535 |
Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing |
Rodney S. Ridley, Gary M. Dolny |
2003-10-21 |
| 6573569 |
Trench MOSFET with low gate charge |
Thomas E. Grebs, Rodney S. Ridley, Louise Skurkey, Chris Gasser |
2003-06-03 |
| 6358825 |
Process for controlling lifetime in a P-I-N diode and for forming diode with improved lifetime control |
Randall L. Case, John L. Benjamin |
2002-03-19 |
| 6077744 |
Semiconductor trench MOS devices |
Thomas E. Grebs |
2000-06-20 |