Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9537001 | Reduction of degradation due to hot carrier injection | Daniel Hahn | 2017-01-03 |
| 8872278 | Integrated gate runner and field implant termination for trench devices | Gary M. Dolny, Mark Rioux | 2014-10-28 |
| 8357562 | Method to improve the reliability of the breakdown voltage in high voltage devices | — | 2013-01-22 |
| 8269277 | RESURF device including increased breakdown voltage | — | 2012-09-18 |
| 7897471 | Method and apparatus to improve the reliability of the breakdown voltage in high voltage devices | — | 2011-03-01 |
| 7436021 | Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing | Rodney S. Ridley, Gary M. Dolny | 2008-10-14 |
| 7332750 | Power semiconductor device with improved unclamped inductive switching capability and process for forming same | John L. Benjamin, Randall L. Case, Jae Jun YUN | 2008-02-19 |
| 6635535 | Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing | Rodney S. Ridley, Gary M. Dolny | 2003-10-21 |
| 6573569 | Trench MOSFET with low gate charge | Thomas E. Grebs, Rodney S. Ridley, Louise Skurkey, Chris Gasser | 2003-06-03 |
| 6358825 | Process for controlling lifetime in a P-I-N diode and for forming diode with improved lifetime control | Randall L. Case, John L. Benjamin | 2002-03-19 |
| 6077744 | Semiconductor trench MOS devices | Thomas E. Grebs | 2000-06-20 |