EK

Eric Kent

AM AMD: 16 patents #689 of 9,279Top 8%
AB Asml Netherlands B.V.: 4 patents #960 of 3,192Top 35%
Overall (All Time): #222,533 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10296681 Process based metrology target design Guangqing Chen, Shufeng Bai, Yen-Wen Lu, Paul Anthony Tuffy, Jen-Shiang Wang +3 more 2019-05-21
10007744 Process based metrology target design Guangqing Chen, Shufeng Bai, Yen-Wen Lu, Paul Anthony Tuffy, Jen-Shiang Wang +3 more 2018-06-26
9804504 Method and apparatus for design of a metrology target Guangqing Chen, Jen-Shiang Wang, Omer Abubaker Omer Adam 2017-10-31
9355200 Method and apparatus for design of a metrology target Guangqing Chen, Jen-Shiang Wang, Omer Abubaker Omer Adam 2016-05-31
6529623 Stepper lens specific reticle compensation for critical dimension control 2003-03-04
6482573 Exposure correction based on reflective index for photolithographic process control Jayendra D. Bhakta, Zicheng Gary Ling, Weizhong Wang, Warren T. Yu 2002-11-19
6418946 Apparatus for automatically cleaning resist nozzle Vincent L. Marinaro, Ted Wakamiya 2002-07-16
6368985 Dual track/stepper interface configuration for wafer processing Ted Wakamiya, Vince L. Marinaro 2002-04-09
6361599 Mechanism for dispensing liquid onto an integrated circuit wafer with minimized back-splash Vincent L. Marinaro 2002-03-26
6360959 Dual resist dispense nozzle for wafer tracks Vince L. Marinaro, Ted Wakamiya 2002-03-26
6336960 System and method for purging air bubbles from filters Vince L. Marinaro, Ted Wakamiya 2002-01-08
6318913 Semiconductor wafer manufacturing method and apparatus for an improved heat exchanger for a photoresist developer Ted Wakamiya, Vincent L. Marinaro 2001-11-20
6299688 Developer nozzle clean combs Vincent L. Marinaro 2001-10-09
6250822 Semiconductor wafer manufacturing method and apparatus for an improved heat exchanger for a photoresist developer Ted Wakamiya, Vincent L. Marinaro 2001-06-26
6245584 Method for detecting adjustment error in photolithographic stepping printer Vincent L. Marinaro 2001-06-12
6238747 Mechanism for dispensing liquid onto an integrated circuit wafer with minimized back-splash Vincent L. Marinaro 2001-05-29
6170494 Method for automatically cleaning resist nozzle Vincent L. Marinaro, Ted Wakamiya 2001-01-09
6130016 Method for forming semiconductor structures using a calibrating reticle 2000-10-10
6082379 Mechanism for cleaning an integrated circuit wafer hot plate while the hot plate is at operating temperature Vincent L. Marinaro 2000-07-04
6051348 Method for detecting malfunction in photolithographic fabrication track Vincent L. Marinaro 2000-04-18