| 6967873 |
Memory device and method using positive gate stress to recover overerased cell |
Darlene Hamilton, Zhizheng Liu, Mark Randolph, Yi He, Kulachet Tanpairoj +2 more |
2005-11-22 |
| 6956768 |
Method of programming dual cell memory device to store multiple data states per cell |
Darlene Hamilton, Kulachet Tanpairoj, Yi He |
2005-10-18 |
| 6901010 |
Erase method for a dual bit memory cell |
Darlene Hamilton, Eric M. Ajimine, Binh Quang Le, Ken Tanpairoj |
2005-05-31 |
| 6822909 |
Method of controlling program threshold voltage distribution of a dual cell memory device |
Darlene Hamilton, Mark Randolph, Edward Franklin Runnion, Kulachet Tanpairoj |
2004-11-23 |
| 6813752 |
Method of determining charge loss activation energy of a memory array |
Darlene Hamilton, Wei Zheng, Mark Randolph, Kulachet Tanpairoj |
2004-11-02 |
| 6791880 |
Non-volatile memory read circuit with end of life simulation |
Kazuhiro Kurihara, Binh Quang Le, Pau-Ling Chen, Darlene Hamilton |
2004-09-14 |
| 6778442 |
Method of dual cell memory device operation for improved end-of-life read margin |
Darlene Hamilton, Kulachet Tanpairoj, Alykhan Madhani, Mimi Lee |
2004-08-17 |
| 6775187 |
Method of programming a dual cell memory device |
Darlene Hamilton, Edward Franklin Runnion, Kulachet Tanpairoj |
2004-08-10 |
| 6771545 |
Method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array |
Eric M. Ajimine, Darlene Hamilton, Pauling Chen, Ming-Huei Shieh, Mark Randolph +2 more |
2004-08-03 |
| 6768673 |
Method of programming and reading a dual cell memory device |
Darlene Hamilton, Kulachet Tanpairoj, Mimi Lee, Alykhan Madhani, Yi He |
2004-07-27 |
| 6436768 |
Source drain implant during ONO formation for improved isolation of SONOS devices |
Jean Y. Yang, Mark T. Ramsbey, Emmanuil Lingunis, Yider Wu, Tazrien Kamal +2 more |
2002-08-20 |
| 6381550 |
Method of utilizing fast chip erase to screen endurance rejects |
Phuong Banh, Darlene Hamilton |
2002-04-30 |
| 5870407 |
Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests |
Jose Hernan Hernandez, Sayan Suanya |
1999-02-09 |
| 5751633 |
Method of screening hot temperature erase rejects at room temperature |
Jose Hernan Hernandez, Sayan Suanya |
1998-05-12 |
| 5724365 |
Method of utilizing redundancy testing to substitute for main array programming and AC speed reads |
Darlene Hamilton, Jose Hernan Hernandez |
1998-03-03 |
| 4798515 |
Variable nozzle area turbine vane cooling |
John Howard Starkweather, William K. Koffel |
1989-01-17 |
| 4573865 |
Multiple-impingement cooled structure |
Raghuram J. Emani, John Howard Starkweather |
1986-03-04 |
| 4526226 |
Multiple-impingement cooled structure |
Raghuram J. Emani, John Howard Starkweather |
1985-07-02 |
