Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8053257 | Method for prediction of premature dielectric breakdown in a semiconductor | Kaushik Chanda, Hazara S. Rathore, Paul S. McLaughlin, Robert D. Edwards, Lawrence A. Clevenger +2 more | 2011-11-08 |
| 7138714 | Via barrier layers continuous with metal line barrier layers at notched or dielectric mesa portions in metal lines | Du Nguyen, Birendra Agarwala, Jawahar P. Nayak, Hazara S. Rathore | 2006-11-21 |
| 6972209 | Stacked via-stud with improved reliability in copper metallurgy | Birendra Agarwala, Hormazdyar M. Dalal, Brett H. Engle, Michael Lane, Ernest N. Levine +8 more | 2005-12-06 |
| 4243435 | Bipolar transistor fabrication process with an ion implanted emitter | Goerge R. Goth, James S. Makris, Arunachala Nagarajan, Raj K. Raheja | 1981-01-06 |