CW

Chen Wang

MG Mentor Graphics: 10 patents #25 of 698Top 4%
SS Siemens Industry Software: 1 patents #111 of 391Top 30%
Overall (All Time): #193,997 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11320487 Programmable test compactor for improving defect determination Wu-Tung Cheng, Mark Kassab 2022-05-03
11090799 Socket holder and socket rack including the same — 2021-08-17
10977400 Deterministic test pattern generation for designs with timing exceptions Wu-Tung Cheng, Kun-Han Tsai, Naixing Wang, Xijiang Lin, Mark Kassab +1 more 2021-04-13
10632606 Socket holder and socket rack including the same — 2020-04-28
10509073 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2019-12-17
9720040 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2017-08-01
9651622 Isometric test compression with low toggling activity Janusz Rajski, Amit Amar Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee +1 more 2017-05-16
9086454 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2015-07-21
8560906 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2013-10-15
8201131 Generating test patterns having enhanced coverage of untargeted defects Janusz Rajski, Huaxing Tang 2012-06-12
8051352 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2011-11-01
7962820 Fault diagnosis of compressed test responses Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2011-06-14
7890827 Compressing test responses using a compactor Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Artur Pogiel 2011-02-15
7765450 Methods for distribution of test generation programs Jon Udell, Mark Kassab, Janusz Rajski 2010-07-27
7743302 Compressing test responses using a compactor Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Artur Pogiel 2010-06-22
7669101 Methods for distributing programs for generating test data Jon Udell, Mark Kassab, Janusz Rajski 2010-02-23
7509600 Generating test patterns having enhanced coverage of untargeted defects Janusz Rajski, Huaxing Tang 2009-03-24
7509550 Fault diagnosis of compressed test responses Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2009-03-24
7437640 Fault diagnosis of compressed test responses having one or more unknown states Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2008-10-14
7386778 Methods for distributing programs for generating test data Jon Udell, Mark Kassab, Janusz Rajski 2008-06-10
7370254 Compressing test responses using a compactor Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Artur Pogiel 2008-05-06
7302624 Adaptive fault diagnosis of compressed test responses Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2007-11-27