Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11798804 | Method of material deposition | Brian Roberts Routh, Jr., Thomas G. Miller, Noel Thomas Franco | 2023-10-24 |
| 11735404 | Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams | Alex DE MARCO, Sergey Gorelick, Joseph Christian, Kenny Mani, Steven Randolph +1 more | 2023-08-22 |
| 11651924 | Method of producing microrods for electron emitters, and associated microrods and electron emitters | Kun Liu, Alan Bahm | 2023-05-16 |
| 11069523 | Method of material deposition | Brian Roberts Routh, Jr., Thomas G. Miller, Noel Thomas Franco | 2021-07-20 |
| 11062879 | Face-on, gas-assisted etching for plan-view lamellae preparation | Noel Thomas Franco, Kenny Mani, Joe Christian, Jeffrey Blackwood | 2021-07-13 |
| 10930514 | Method and apparatus for the planarization of surfaces | Philip Brundage, Zachary Klassen | 2021-02-23 |
| 10546719 | Face-on, gas-assisted etching for plan-view lamellae preparation | Noel Thomas Franco, Kenny Mani, Joe Christian, Jeffrey Blackwood | 2020-01-28 |
| 10347463 | Enhanced charged particle beam processes for carbon removal | Joe Christian, Kenny Mani, Noel Thomas Franco | 2019-07-09 |
| 10325754 | Ion implantation to alter etch rate | David Foord | 2019-06-18 |
| 10190953 | Tomography sample preparation systems and methods with improved speed, automation, and reliability | Guillaume Delpy, Guillaume Audoit, Laurens Franz Taemsz Kwakman, Jorge Filevich | 2019-01-29 |
| 9983152 | Material characterization using ion channeling imaging | Steven Randolph | 2018-05-29 |
| 9978586 | Method of material deposition | Brian Roberts Routh, Jr., Thomas G. Miller, Noel Thomas Franco | 2018-05-22 |
| 9761467 | Gas injection system with precursor for planar deprocessing of semiconductor devices using a focused ion beam | Clive D. Chandler | 2017-09-12 |
| 9443697 | Low energy ion beam etch | — | 2016-09-13 |
| 9087366 | High accuracy beam placement for local area navigation | Richard Young, Peter D. Carleson, Reinier Louis Warschauer | 2015-07-21 |
| 9064811 | Precursor for planar deprocessing of semiconductor devices using a focused ion beam | Clive D. Chandler | 2015-06-23 |
| 8781219 | High accuracy beam placement for local area navigation | Reinier Louis Warschauer, Richard Young, Peter D. Carleson | 2014-07-15 |
| 8610092 | Charged particle beam processing system with visual and infrared imaging | Enrique Agorio | 2013-12-17 |
| 8455822 | Navigation and sample processing using an ion source containing both low-mass and high-mass species | — | 2013-06-04 |
| 8358832 | High accuracy beam placement for local area navigation | Richard Young, Peter D. Carleson | 2013-01-22 |
| 8059918 | High accuracy beam placement for local area navigation | Richard Young, Peter D. Carleson | 2011-11-15 |
| 7781733 | In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques | Steven B. Herschbein, Herschel M. Marchman, Narender Rana | 2010-08-24 |
| 7351966 | High-resolution optical channel for non-destructive navigation and processing of integrated circuits | Herschel M. Marchman, Steven B. Herschbein, Michael Renner, Narender Rana | 2008-04-01 |
| 7119333 | Ion detector for ion beam applications | Steven B. Herschbein, Narender Rana, Michael Sievers | 2006-10-10 |
| 6946064 | Sample mount for performing sputter-deposition in a focused ion beam (FIB) tool | Lawrence Fischer, Steven B. Herschbein | 2005-09-20 |