| 8008142 |
Self-aligned Schottky diode |
Alan B. Botula, Alvin J. Joseph, Robert M. Rassel, Yun Shi |
2011-08-30 |
| 7463548 |
Method for performing a burn-in test |
Samuel Weinstein, Stephan Wuensche |
2008-12-09 |
| 7243276 |
Method for performing a burn-in test |
Samuel Weinstein, Stephan Wuensche |
2007-07-10 |
| 7221601 |
Timer lockout circuit for synchronous applications |
Mark D. Jacunski, Samuel Weinstein |
2007-05-22 |
| 7194670 |
Command multiplier for built-in-self-test |
Jonathan R. Fales, Gregory J. Fredeman, Kevin W. Gorman, Mark D. Jacunski, Toshiaki Kirihata +2 more |
2007-03-20 |
| 7068564 |
Timer lockout circuit for synchronous applications |
Mark D. Jacunski, Samuel Weinstein |
2006-06-27 |
| 6708298 |
Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices |
William E. Corbin, Jr., David P. Monty, Erik A. Nelson, Steven W. Tomashot, David Chapman +1 more |
2004-03-16 |
| 6658604 |
Method for testing and guaranteeing that skew between two signals meets predetermined criteria |
William R. J. Corbin, David P. Monty, Erik A. Nelson, Steven W. Tomashot, David Chapman +1 more |
2003-12-02 |
| 6330697 |
Apparatus and method for performing a defect leakage screen test for memory devices |
Michael Patrick Clinton, Klaus Enk, Russell J. Houghton, Josef Schnell |
2001-12-11 |
