Anna Golotsvan — 13 Patents | Patent Leaderboard

Anna Golotsvan has been granted 13 US patents. The first was granted in 2022 and the most recent in February 2025. Anna Golotsvan ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list Anna Golotsvan in Kiryat Tivon, CA, IL.

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Showing 1–13 of 13 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12222199	Systems and methods for measurement of misregistration and amelioration thereof	Roie Volkovich, Nachshon Rothman, Yossi Simon, Vladimir Levinski, Nireekshan K. Reddy +3 more	2025-02-11
12013634	Reduction or elimination of pattern placement error in metrology measurements	Yoel Feler, Vladimir Levinski, Roel Gronheid, Sharon Aharon, Evgeni Gurevich +1 more	2024-06-18
12001148	Enhancing performance of overlay metrology	Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more	2024-06-04	$682,528,000
11862521	Multiple-tool parameter set calibration and misregistration measurement system and method	Roie Volkovich	2024-01-02	$241,911,000
11809090	Composite overlay metrology target	Inna Steely-Tarshish, Mark Ghinovker, Rawi Dirawi	2023-11-07	$236,637,000
11761969	System and method for analyzing a sample with a dynamic recipe based on iterative experimentation and feedback	Renan Milo, Roie Volkovich, Tal Yaziv, Nir BenDavid	2023-09-19	$220,227,000
11726410	Multi-resolution overlay metrology targets	Eitan Hajaj, Amnon Manassen, Shlomo Eisenbach, Yoav Grauer, Eugene Maslovsky	2023-08-15	$114,639,000
11615974	Fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing	Amnon Manassen, Tzahi Grunzweig, Einat Peled	2023-03-28	$65,110,000
11592755	Enhancing performance of overlay metrology	Amnon Manassen, Andrew V. Hill, Yonatan Vaknin, Yossi Simon, Daria Negri +9 more	2023-02-28	$124,026,000
11551980	Dynamic amelioration of misregistration measurement	Roie Volkovich, Eyal Abend	2023-01-10
11537043	Reduction or elimination of pattern placement error in metrology measurements	Yoel Feler, Vladimir Levinski, Roel Gronheid, Sharon Aharon, Evgeni Gurevich +1 more	2022-12-27
11353493	Data-driven misregistration parameter configuration and measurement system and method	Shlomit Katz, Roie Volkovich, Raviv Yohanan	2022-06-07
11353799	System and method for error reduction for metrology measurements	Roie Volkovich, Liran Yerushalmi, Rawi Dirawi, Chen Dror, Nir BenDavid +3 more	2022-06-07

Anna Golotsvan — 13 Patents

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