| 12399135 |
Optical inspection tool and inspection method for inspecting multifaceted groove specimens |
Jianyong Mo, Fan Fan |
2025-08-26 |
| 12345694 |
Automatic watermelon inspection apparatus |
Sihui Dai, Jingjing Huang, Ming Li, Ting Zou, Yongwei Xu +9 more |
2025-07-01 |
| 12298572 |
Device, method and system for optical communication with a photonic integrated circuit chip and a transverse oriented lens structure |
Changhua Liu, Pooya Tadayon, Zhichao Zhang, Srikant Nekkanty |
2025-05-13 |
| 12216301 |
Apparatuses and methods for inspecting embedded features |
Jacob Chesna, Jianyong Mo, Fan Fan |
2025-02-04 |
| 12164147 |
Device, method and system for optical communication with a waveguide structure and an integrated optical coupler of a photonic integrated circuit chip |
Changhua Liu, Pooya Tadayon, Zhichao Zhang |
2024-12-10 |
| 11913772 |
Non-destructive gap metrology |
Jianyong Mo, V Wade Singleton, Yiren Wu, David Wasinger |
2024-02-27 |
| 11644757 |
Method to achieve tilted patterning with a through resist thickness using projection optics |
Changhua Liu, Jianyong Mo |
2023-05-09 |
| 10794840 |
Apparatus for semiconductor package inspection |
Jianyong Mo, Darren Vance, Di Xu, Gregory S. Clemons, Robert F. Wiedmaier |
2020-10-06 |
| 10572992 |
2D metrology technique for solder paste inspection |
Alireza Ashari, Curt Carboni, Jason Jones, Robert F. Wiedmaier, Di Xu +1 more |
2020-02-25 |
| 10401286 |
Reflectivity analysis to determine material on a surface |
Jianyong Mo, Darren Vance, Di Xu |
2019-09-03 |
| 10066927 |
Inspection of microelectronic devices using near-infrared light |
Zhihua Zou, Osborne A. Martin, III, Robert F. Wiedmaier |
2018-09-04 |
| 9488595 |
Inspection of microelectronic devices using near-infrared light |
Zhihua Zou, Osborne A. Martin, III, Robert F. Wiedmaier |
2016-11-08 |
| 8399264 |
Alignment inspection |
Zhihua Zou, Sheng Li, Tamil Selvy Selvamuniandy |
2013-03-19 |