Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269758 | Systems and processes for measuring thickness values of semiconductor substrates | Sudip M. Thomas | 2019-04-23 |
| 10066927 | Inspection of microelectronic devices using near-infrared light | Liang Zhang, Osborne A. Martin, III, Robert F. Wiedmaier | 2018-09-04 |
| 9488595 | Inspection of microelectronic devices using near-infrared light | Liang Zhang, Osborne A. Martin, III, Robert F. Wiedmaier | 2016-11-08 |
| 8399264 | Alignment inspection | Liang Zhang, Sheng Li, Tamil Selvy Selvamuniandy | 2013-03-19 |