Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10794840 | Apparatus for semiconductor package inspection | Liang Zhang, Jianyong Mo, Darren Vance, Di Xu, Gregory S. Clemons | 2020-10-06 |
| 10572992 | 2D metrology technique for solder paste inspection | Alireza Ashari, Curt Carboni, Jason Jones, Di Xu, Wei Yan +1 more | 2020-02-25 |
| 10066927 | Inspection of microelectronic devices using near-infrared light | Liang Zhang, Zhihua Zou, Osborne A. Martin, III | 2018-09-04 |
| 9488595 | Inspection of microelectronic devices using near-infrared light | Liang Zhang, Zhihua Zou, Osborne A. Martin, III | 2016-11-08 |