Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10794840 | Apparatus for semiconductor package inspection | Liang Zhang, Jianyong Mo, Di Xu, Gregory S. Clemons, Robert F. Wiedmaier | 2020-10-06 |
| 10401286 | Reflectivity analysis to determine material on a surface | Jianyong Mo, Di Xu, Liang Zhang | 2019-09-03 |