Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12402349 | Gate-all-around integrated circuit structures having devices with channel-to-substrate electrical contact | Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more | 2025-08-26 |
| 12328946 | ESD protection decoupled from diffusion | Urusa Alaan, Abhishek A. Sharma, Charles C. Kuo, Nicholas A. Thomson, Ayan Kar +6 more | 2025-06-10 |
| 12328947 | Substrate-less silicon controlled rectifier (SCR) integrated circuit structures | Rui Ma, Kalyan C. Kolluru, Nicholas A. Thomson, Ayan Kar, Nathan Jack +3 more | 2025-06-10 |
| 12317590 | Substrate-free integrated circuit structures | Biswajeet Guha, Brian J. Greene, Avyaya Jayanthinarasimham, Ayan Kar, Chung-Hsun Lin +9 more | 2025-05-27 |
| 12288789 | Gate-all-around integrated circuit structures having devices with source/drain-to-substrate electrical contact | Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more | 2025-04-29 |
| 11996403 | ESD diode solution for nanoribbon architectures | Nidhi Nidhi, Rahul Ramaswamy, Walid M. Hafez, Hsu-Yu Chang, Ting Chang +4 more | 2024-05-28 |
| 11908856 | Gate-all-around integrated circuit structures having devices with source/drain-to-substrate electrical contact | Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more | 2024-02-20 |
| 11837641 | Gate-all-around integrated circuit structures having adjacent deep via substrate contacts for sub-fin electrical contact | Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more | 2023-12-05 |
| 11824116 | Gate-all-around integrated circuit structures having devices with channel-to-substrate electrical contact | Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more | 2023-11-21 |
| 10082534 | Directional pulse injection into a microelectronic system for electrostatic test | Harald Gossner, Krzysztof Domanski, David Johnsson | 2018-09-25 |
| 10006942 | Board, integrated circuit testing arrangement, and method for operating an integrated circuit | Harald Gossner | 2018-06-26 |