BO

Benjamin Orr

IN Intel: 11 patents #3,700 of 30,777Top 15%
Overall (All Time): #435,556 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12402349 Gate-all-around integrated circuit structures having devices with channel-to-substrate electrical contact Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more 2025-08-26
12328946 ESD protection decoupled from diffusion Urusa Alaan, Abhishek A. Sharma, Charles C. Kuo, Nicholas A. Thomson, Ayan Kar +6 more 2025-06-10
12328947 Substrate-less silicon controlled rectifier (SCR) integrated circuit structures Rui Ma, Kalyan C. Kolluru, Nicholas A. Thomson, Ayan Kar, Nathan Jack +3 more 2025-06-10
12317590 Substrate-free integrated circuit structures Biswajeet Guha, Brian J. Greene, Avyaya Jayanthinarasimham, Ayan Kar, Chung-Hsun Lin +9 more 2025-05-27
12288789 Gate-all-around integrated circuit structures having devices with source/drain-to-substrate electrical contact Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more 2025-04-29
11996403 ESD diode solution for nanoribbon architectures Nidhi Nidhi, Rahul Ramaswamy, Walid M. Hafez, Hsu-Yu Chang, Ting Chang +4 more 2024-05-28
11908856 Gate-all-around integrated circuit structures having devices with source/drain-to-substrate electrical contact Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more 2024-02-20
11837641 Gate-all-around integrated circuit structures having adjacent deep via substrate contacts for sub-fin electrical contact Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more 2023-12-05
11824116 Gate-all-around integrated circuit structures having devices with channel-to-substrate electrical contact Biswajeet Guha, William Hsu, Chung-Hsun Lin, Kinyip Phoa, Oleg Golonzka +5 more 2023-11-21
10082534 Directional pulse injection into a microelectronic system for electrostatic test Harald Gossner, Krzysztof Domanski, David Johnsson 2018-09-25
10006942 Board, integrated circuit testing arrangement, and method for operating an integrated circuit Harald Gossner 2018-06-26