Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11549963 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Kristof Paredis, Jonathan Op de Beeck, Claudia Fleischmann | 2023-01-10 |
| 11125805 | Device for measuring surface characteristics of a material | Kristof Paredis, Umberto Celano | 2021-09-21 |
| 10746759 | Method for determining the shape of a sample tip for atom probe tomography | Kristof Paredis, Claudia Fleischmann | 2020-08-18 |
| 10541108 | Method and apparatus for transmission electron microscopy | Umberto Celano, Kristof Paredis | 2020-01-21 |
| 10495666 | Device and method for two dimensional active carrier profiling of semiconductor components | Kristof Paredis, Umberto Celano, Oberon Dixon-Luinenburg | 2019-12-03 |
| 10014178 | Method for differential heating of elongate nano-scaled structures | Janusz Bogdanowicz | 2018-07-03 |
| 9612258 | Probe configuration and method of fabrication thereof | Thomas Hantschel, Menelaos Tsigkourakos | 2017-04-04 |
| 9588137 | Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up | Pierre Eyben, Ruping Cao, Andreas Schulze | 2017-03-07 |
| 8872230 | Tunnel field-effect transistor and methods for manufacturing thereof | Anne S. Verhulst, Thomas Hantschel, Cedric Huyghebaert | 2014-10-28 |
| 8717570 | Method for determining the active doping concentration of a doped semiconductor region | Janusz Bogdanowicz, Trudo Clarysse | 2014-05-06 |
| 8484761 | Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof | Thomas Hantschel, Kai Arstila | 2013-07-09 |
| 8232517 | Wavelength-sensitive detector comprising photoconductor units each having different types of elongated nanostructures | Anne S. Verhulst | 2012-07-31 |
| 8211812 | Method for fabricating a high-K dielectric layer | Lars-Ake Ragnarsson, Paul A. Zimmerman, Kazuhiko Yamamoto, Tom Schram, Wim Deweerd +2 more | 2012-07-03 |
| 7598482 | Wavelength-sensitive detector with elongate nanostructures | Anne S. Verhulst | 2009-10-06 |
| 7133128 | System and method for measuring properties of a semiconductor substrate in a non-destructive way | Trudo Clarysse | 2006-11-07 |
| 6823723 | Method and apparatus for performing atomic force microscopy measurements | Pierre Eyben | 2004-11-30 |
| 6809317 | Method and apparatus for local surface analysis | — | 2004-10-26 |
| 6756584 | Probe tip and method of manufacturing probe tips by peel-off | Thomas Hantschel | 2004-06-29 |
| 6690008 | Probe and method of manufacturing mounted AFM probes | Thomas Hantschel | 2004-02-10 |
| 6504152 | Probe tip configuration and a method of fabrication thereof | Thomas Hantschel | 2003-01-07 |
| 6328902 | Probe tip configuration and a method of fabrication thereof | Thomas Hantschel | 2001-12-11 |
| 6201401 | Method for measuring the electrical potential in a semiconductor element | Louis C. Hellemans, Thomas Trenkler, Peter De Wolf | 2001-03-13 |
| 6091248 | Method for measuring the electrical potential in a semiconductor element | Louis C. Hellemans, Thomas Trenkler, Peter De Wolf | 2000-07-18 |
| 5995912 | Database and method for measurement correction for cross-sectional carrier profiling techniques | Peter Dewolf, Trudo Clarysse | 1999-11-30 |
| 5723981 | Method for measuring the electrical potential in a semiconductor element | Louis C. Hellemans, Thomas Trenkler, Peter De Wolf | 1998-03-03 |