Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6287880 | Method and apparatus for high resolution profiling in semiconductor structures | Andrew Norman Erickson | 2001-09-11 |
| 6201401 | Method for measuring the electrical potential in a semiconductor element | Louis C. Hellemans, Thomas Trenkler, Wilfried Vandervorst | 2001-03-13 |
| 6091248 | Method for measuring the electrical potential in a semiconductor element | Louis C. Hellemans, Thomas Trenkler, Wilfried Vandervorst | 2000-07-18 |
| 5723981 | Method for measuring the electrical potential in a semiconductor element | Louis C. Hellemans, Thomas Trenkler, Wilfried Vandervorst | 1998-03-03 |
| 5585734 | Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope | Marc Meuris, Wilfried Vandervorst | 1996-12-17 |