Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11549963 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Kristof Paredis, Jonathan Op de Beeck, Wilfried Vandervorst | 2023-01-10 |
| 10746759 | Method for determining the shape of a sample tip for atom probe tomography | Kristof Paredis, Wilfried Vandervorst | 2020-08-18 |