Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11549963 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Jonathan Op de Beeck, Claudia Fleischmann, Wilfried Vandervorst | 2023-01-10 |
| 11125805 | Device for measuring surface characteristics of a material | Umberto Celano, Wilfried Vandervorst | 2021-09-21 |
| 11112427 | Method and tip substrate for scanning probe microscopy | Thomas Hantschel, Hugo Bender, Antti Kanniainen | 2021-09-07 |
| 10746759 | Method for determining the shape of a sample tip for atom probe tomography | Claudia Fleischmann, Wilfried Vandervorst | 2020-08-18 |
| 10541108 | Method and apparatus for transmission electron microscopy | Umberto Celano, Wilfried Vandervorst | 2020-01-21 |
| 10495666 | Device and method for two dimensional active carrier profiling of semiconductor components | Umberto Celano, Wilfried Vandervorst, Oberon Dixon-Luinenburg | 2019-12-03 |