KP

Kristof Paredis

IV Imec Vzw: 6 patents #84 of 1,046Top 9%
KR Katholieke Universiteit Leuven, Ku Leuven R&D: 1 patents #173 of 512Top 35%
📍 Oud-Heverlee, BE: #15 of 87 inventorsTop 20%
Overall (All Time): #804,442 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
11549963 Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample Jonathan Op de Beeck, Claudia Fleischmann, Wilfried Vandervorst 2023-01-10
11125805 Device for measuring surface characteristics of a material Umberto Celano, Wilfried Vandervorst 2021-09-21
11112427 Method and tip substrate for scanning probe microscopy Thomas Hantschel, Hugo Bender, Antti Kanniainen 2021-09-07
10746759 Method for determining the shape of a sample tip for atom probe tomography Claudia Fleischmann, Wilfried Vandervorst 2020-08-18
10541108 Method and apparatus for transmission electron microscopy Umberto Celano, Wilfried Vandervorst 2020-01-21
10495666 Device and method for two dimensional active carrier profiling of semiconductor components Umberto Celano, Wilfried Vandervorst, Oberon Dixon-Luinenburg 2019-12-03