AK

Antti Kanniainen

IV Imec Vzw: 1 patents #463 of 1,046Top 45%
Overall (All Time): #2,748,007 of 4,157,543Top 70%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11112427 Method and tip substrate for scanning probe microscopy Thomas Hantschel, Hugo Bender, Kristof Paredis 2021-09-07