JB

Jonathan Op de Beeck

IV Imec Vzw: 1 patents #463 of 1,046Top 45%
KR Katholieke Universiteit Leuven, Ku Leuven R&D: 1 patents #173 of 512Top 35%
Overall (All Time): #2,561,031 of 4,157,543Top 65%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11549963 Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample Kristof Paredis, Claudia Fleischmann, Wilfried Vandervorst 2023-01-10