Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5585734 | Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope | Marc Meuris, Peter De Wolf | 1996-12-17 |
| 5369372 | Method for resistance measurements on a semiconductor element with controlled probe pressure | Marc Meuris | 1994-11-29 |