Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8717570 | Method for determining the active doping concentration of a doped semiconductor region | Janusz Bogdanowicz, Wilfried Vandervorst | 2014-05-06 |
| 8364428 | Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor | Frederic Schaus | 2013-01-29 |
| 8314628 | Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate | Fabian Dortu | 2012-11-20 |
| 7751035 | Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures | Janusz Bogdanowicz | 2010-07-06 |
| 7133128 | System and method for measuring properties of a semiconductor substrate in a non-destructive way | Wilfried Vandervorst | 2006-11-07 |
| 5995912 | Database and method for measurement correction for cross-sectional carrier profiling techniques | Peter Dewolf, Wilfried Vandervorst | 1999-11-30 |