Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216057 | Method and apparatus for measuring a lateral depth in a microstructure | Thomas Nuytten | 2025-02-04 |
| 10014178 | Method for differential heating of elongate nano-scaled structures | Wilfried Vandervorst | 2018-07-03 |
| 8817262 | Method for determining the doping profile of a partially activated doped semiconductor region | — | 2014-08-26 |
| 8717570 | Method for determining the active doping concentration of a doped semiconductor region | Trudo Clarysse, Wilfried Vandervorst | 2014-05-06 |
| 8634080 | Method for determining an active dopant concentration profile | — | 2014-01-21 |
| 8384904 | Method and apparatus for determining the junction depth of a semiconductor region | — | 2013-02-26 |
| 7751035 | Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures | Trudo Clarysse | 2010-07-06 |