Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216057 | Method and apparatus for measuring a lateral depth in a microstructure | Janusz Bogdanowicz | 2025-02-04 |
| 11898958 | Method for measuring the trap density in a 2-dimensional semiconductor material | Alessandra Leonhardt, Cesar Javier Lockhart De La Rosa, Stefan De Gendt, Cedric Huyghebaert, Steven Brems | 2024-02-13 |