Issued Patents All Time
Showing 51–73 of 73 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7834649 | Method and apparatus for statistical CMOS device characterization | Kanak B. Agarwal, Jerry D. Hayes | 2010-11-16 |
| 7827217 | Method and system for a grid-enabled virtual machine with movable objects | Scott J. Broussard, Eduardo N. Spring | 2010-11-02 |
| 7782076 | Method and apparatus for statistical CMOS device characterization | Kanak B. Agarwal, Jerry D. Hayes | 2010-08-24 |
| 7716620 | Moment-based method and system for evaluation of metal layer transient currents in an integrated circuit | Kanak B. Agarwal | 2010-05-11 |
| 7707017 | System modeling facilitating method and apparatus | Haiqi Liang, Dong Hui Liu, Zhong Tian, Jian Wang, Xin Zhou +1 more | 2010-04-27 |
| 7647577 | Editing, creating, and verifying reorganization of flowchart, and transforming between flowchart and tree diagram | Jian Wang, Jun Zhu, Sheng Ye, Jing Li, Hai Qi Liang +1 more | 2010-01-12 |
| 7622942 | Method and apparatus for measuring device mismatches | Kanak B. Agarwal, Chandler McDowell, Sani R. Nassif, James Plusquellic, Jayakumaran Sivagnaname | 2009-11-24 |
| 7526515 | Method and system for a grid-enabled virtual machine with movable objects | Scott J. Broussard, Eduardo N. Spring | 2009-04-28 |
| 7519526 | Charge-based circuit analysis | Emrah Acar, Bhavna Agrawal, Peter Feldmann, Steven G. Walker | 2009-04-14 |
| 7496552 | Method for rule compliance situation checking and related checking system | Ying Huang, Haiqi Liang, Birgit M. Pfitzmann, Jian Wang, Xin Zhou +1 more | 2009-02-24 |
| 7496932 | Communicating with remote objects in a data processing network | Scott J. Broussard, Eduardo N. Spring | 2009-02-24 |
| 7487374 | Dynamic power and clock-gating method and circuitry with sleep mode based on estimated time for receipt of next wake-up signal | Jente B. Kuang, Hung C. Ngo | 2009-02-03 |
| 7441213 | Method for testing the validity of initial-condition statements in circuit simulation, and correcting inconsistencies thereof | Timothy Lehner, Richard Daniel Kimmel, Ali Sadigh, Emrah Acar, Ivan L. Wemple | 2008-10-21 |
| 7408372 | Method and apparatus for measuring device mismatches | Kanak B. Agarwal, Chandler McDowell, Sani R. Nassif, James Plusquellic, Jayakumaran Sivagnaname | 2008-08-05 |
| 7397259 | Method and apparatus for statistical CMOS device characterization | Kanak B. Agarwal, Jerry D. Hayes | 2008-07-08 |
| 7394276 | Active cancellation matrix for process parameter measurements | Fadi H. Gebara, Jayakumaran Sivagnaname, Ivan Vo | 2008-07-01 |
| 7346867 | Method for estimating propagation noise based on effective capacitance in an integrated circuit chip | Haihua Su, David J. Widiger, Byron L. Krauter, Chandramouli V. Kashyap | 2008-03-18 |
| 6963637 | Methods, systems, and media to capture a redialing sequence and to redial | Scott J. Broussard, Mark A. Sehorne, Eduardo N. Spring | 2005-11-08 |
| 6950996 | Interconnect delay and slew metrics based on the lognormal distribution | Charles J. Alpert, Anirudh Devgan, Chandramouli V. Kashyap | 2005-09-27 |
| 6868533 | Method and system for extending delay and slew metrics to ramp inputs | Charles J. Alpert, Anirudh Devgan, Chandramouli V. Kashyap | 2005-03-15 |
| 6842714 | Method for determining the leakage power for an integrated circuit | Emrah Acar, Anirudh Devgan, Sani R. Nassif, Haihua Su | 2005-01-11 |
| 6807659 | Robust delay metric for RC circuits | Charles J. Alpert, Chandramouli V. Kashyap | 2004-10-19 |
| 6731129 | Apparatus for measuring capacitance of a semiconductor device | Wendy A. Belluomini, Chandler McDowell, Sani R. Nassif | 2004-05-04 |