| 7734444 |
Systems and arrangements to assess thermal performance |
Ronald Xavier Arroyo, William A. Ciarfella, Bret P. Elison, Gary F. Goth, Terrance Wayne Kueper +2 more |
2010-06-08 |
| 7338818 |
Systems and arrangements to assess thermal performance |
Ronald Xavier Arroyo, William A. Ciarfella, Bret P. Elison, Gary F. Goth, Terrance Wayne Kueper +2 more |
2008-03-04 |
| 6285080 |
Planar metallized substrate with embedded camber control material and method thereof |
Raschid J. Bezama, Alan Piciacchio, Robert A. Rita |
2001-09-04 |
| 5946552 |
Universal cost reduced substrate structure method and apparatus |
Myra Muth Boenke, Jason L. Frankel, Sarah H. Knickerbocker, Ahmed Sayeed Shah |
1999-08-31 |
| 5831810 |
Electronic component package with decoupling capacitors completely within die receiving cavity of substrate |
Peter J. Brofman, Francis F. Cappo, Jason L. Frankel, Suresh D. Kadakia, Sarah H. Knickerbocker +1 more |
1998-11-03 |
| 5220617 |
Method and apparatus for object inspection |
Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller, Lawrence D. Thorp |
1993-06-15 |
| 5216485 |
Advanced via inspection tool (AVIT) |
Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller, Lawrence D. Thorp |
1993-06-01 |