Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7935629 | Semiconductor scheme for reduced circuit area in a simplified process | Todd A. Christensen, Richard Lee Donze, William Paul Hovis, John E. Sheets, II | 2011-05-03 |
| 7734444 | Systems and arrangements to assess thermal performance | Ronald Xavier Arroyo, Kenneth A. Bird, William A. Ciarfella, Bret P. Elison, Gary F. Goth +2 more | 2010-06-08 |
| 7696565 | FinFET body contact structure | Richard Lee Donze, Karl R. Erickson, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff | 2010-04-13 |
| 7626220 | Semiconductor scheme for reduced circuit area in a simplified process | Todd A. Christensen, Richard Lee Donze, William Paul Hovis, John E. Sheets, II | 2009-12-01 |
| 7541829 | Method for correcting for asymmetry of threshold voltage shifts | Ronald J. Bolam, David P. Paulsen, John E. Sheets, II | 2009-06-02 |
| 7338818 | Systems and arrangements to assess thermal performance | Ronald Xavier Arroyo, Kenneth A. Bird, William A. Ciarfella, Bret P. Elison, Gary F. Goth +2 more | 2008-03-04 |
| 7317217 | Semiconductor scheme for reduced circuit area in a simplified process | Todd A. Christensen, Richard Lee Donze, William Paul Hovis, John E. Sheets, II | 2008-01-08 |
| 7317605 | Method and apparatus for improving performance margin in logic paths | Richard Lee Donze, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff | 2008-01-08 |
| 7241649 | FinFET body contact structure | Richard Lee Donze, Karl R. Erickson, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff | 2007-07-10 |
| 7227183 | Polysilicon conductor width measurement for 3-dimensional FETs | Richard Lee Donze, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff | 2007-06-05 |
| 7184924 | Method, apparatus and computer program product for implementing thermal integrity screening | Peter James Shabino | 2007-02-27 |
| 7009905 | Method and apparatus to reduce bias temperature instability (BTI) effects | Anthony Gus Aipperspach, William Paul Hovis, John E. Sheets, II | 2006-03-07 |
| 6879177 | Method and testing circuit for tracking transistor stress degradation | Ronald J. Bolam, William Paul Hovis | 2005-04-12 |
| 6774734 | Ring oscillator circuit for EDRAM/DRAM performance monitoring | Todd A. Christensen, John E. Sheets, II | 2004-08-10 |
| 6198316 | CMOS off-chip driver circuit | David J. Krolak | 2001-03-06 |
| 4553047 | Regulator for substrate voltage generator | Thomas Dillinger | 1985-11-12 |