Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5220617 | Method and apparatus for object inspection | Kenneth A. Bird, Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller | 1993-06-15 |
| 5216485 | Advanced via inspection tool (AVIT) | Kenneth A. Bird, Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller | 1993-06-01 |
| 5168454 | Formation of high quality patterns for substrates and apparatus therefor | Mark J. LaPlante, Mark Gerald LaVine, David C. Long, Poyang Lu, John J. Seksinsky +1 more | 1992-12-01 |