Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960523 | Method of reducing erosion of a nitride gate cap layer during reactive ion etch of nitride liner layer for bit line contact of DRAM device | Michael Maldei, Prakash Dev, David M. Dobuzinsky, Johnathan E. Faltermeier, Thomas Rupp +3 more | 2005-11-01 |
| 6342131 | Method of depositing a multilayer thin film by means of magnetron sputtering which controls the magnetic field | Viraj Y. Sardesai, Tomio Katata, Christopher Parks | 2002-01-29 |
| 6046487 | Shallow trench isolation with oxide-nitride/oxynitride liner | David M. Dobuzinsky, Philip L. Flaitz, Erwin Hammerl, Herbert L. Ho, James F. Moseman +3 more | 2000-04-04 |
| 5763315 | Shallow trench isolation with oxide-nitride/oxynitride liner | David M. Dobuzinsky, Philip L. Flaitz, Erwin Hammerl, Herbert L. Ho, James F. Moseman +3 more | 1998-06-09 |