EF

Eric A. Foreman

IBM: 81 patents #829 of 70,183Top 2%
Globalfoundries: 9 patents #393 of 4,424Top 9%
GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%
📍 Saint Albans, VT: #1 of 84 inventorsTop 2%
🗺 Vermont: #59 of 4,968 inventorsTop 2%
Overall (All Time): #17,590 of 4,157,543Top 1%
91
Patents All Time

Issued Patents All Time

Showing 76–91 of 91 patents

Patent #TitleCo-InventorsDate
7962874 Method and system for evaluating timing in an integrated circuit Peter A. Habitz, David J. Hathaway, Jerry D. Hayes, Anthony D. Polson 2011-06-14
7886246 Methods for identifying failing timing requirements in a digital design Nathan C. Buck, John P. Dubuque, Peter A. Habitz, Chandramouli Visweswariah 2011-02-08
7873926 Methods for practical worst test definition and debug during block based statistical static timing analysis Nathan C. Buck, James C. Gregerson, Jeffrey G. Hemmett 2011-01-18
7870525 Slack sensitivity to parameter variation based timing analysis Peter A. Habitz, David J. Hathaway, Jerry D. Hayes, Jeffrey H. Oppold, Anthony D. Polson 2011-01-11
7844932 Method to identify timing violations outside of manufacturing specification limits Nathan C. Buck, John P. Dubuque, Peter A. Habitz, Chandramouli Visweswariah 2010-11-30
7797657 Parameter ordering for multi-corner static timing analysis Nathan C. Buck, John P. Dubuque, Peter A. Habitz, Kerim Kalafala, Peihua Qi +2 more 2010-09-14
7784003 Estimation of process variation impact of slack in multi-corner path-based static timing analysis Nathan C. Buck, John P. Dubuque, Peter A. Habitz, Kerim Kalafala, Jeffrey M. Ritzinger +1 more 2010-08-24
7750648 Method to quickly estimate inductance for timing models Peter A. Habitz, Mark R. Lasher, William J. Livingstone, Gregory M. Schaeffer 2010-07-06
7716616 Slack sensitivity to parameter variation based timing analysis Peter A. Habitz, David J. Hathaway, Jerry D. Hayes, Jeffrey H. Oppold, Anthony D. Polson 2010-05-11
7681157 Variable threshold system and method for multi-corner static timing analysis Nathan C. Buck, John P. Dubuque, Peter A. Habitz, Kerim Kalafala, Peihua Qi +2 more 2010-03-16
7620921 IC chip at-functional-speed testing with process coverage evaluation Gary D. Grise, Peter A. Habitz, Vikram Iyengar, David E. Lackey, Chandramouli Visweswariah +2 more 2009-11-17
7555740 Method and system for evaluating statistical sensitivity credit in path-based hybrid multi-corner static timing analysis Nathan C. Buck, John P. Dubuque, Peter A. Habitz, Kerim Kalafala, Peihua Qi +2 more 2009-06-30
7444608 Method and system for evaluating timing in an integrated circuit Peter A. Habitz, David J. Hathaway, Jerry D. Hayes, Anthony D. Polson 2008-10-28
7401307 Slack sensitivity to parameter variation based timing analysis Peter A. Habitz, David J. Hathaway, Jerry D. Hayes, Jeffrey H. Oppold, Anthony D. Polson 2008-07-15
7181711 Prioritizing of nets for coupled noise analysis Peter A. Habitz, Gregory M. Schaeffer 2007-02-20
7089143 Method and system for evaluating timing in an integrated circuit Peter A. Habitz, David J. Hathaway, Jerry D. Hayes, Anthony D. Polson 2006-08-08