ES

Edmund J. Sprogis

IBM: 102 patents #541 of 70,183Top 1%
Globalfoundries: 8 patents #444 of 4,424Top 15%
UL Ultratech: 2 patents #39 of 110Top 40%
📍 Williston, VT: #4 of 203 inventorsTop 2%
🗺 Vermont: #45 of 4,968 inventorsTop 1%
Overall (All Time): #11,536 of 4,157,543Top 1%
112
Patents All Time

Issued Patents All Time

Showing 101–112 of 112 patents

Patent #TitleCo-InventorsDate
6279815 Stacked chip process carrier George C. Correia, John Cronin 2001-08-28
6265771 Dual chip with heat sink Thomas G. Ference, Wayne J. Howell 2001-07-24
6225699 Chip-on-chip interconnections of varied characteristics Thomas G. Ference, Wayne J. Howell 2001-05-01
6213376 Stacked chip process carrier George C. Correia, John Cronin 2001-04-10
5977640 Highly integrated chip-on-chip packaging Claude L. Bertin, Thomas G. Ference, Wayne J. Howell 1999-11-02
5935763 Self-aligned pattern over a reflective layer Michael Caterer, Timothy H. Daubenspeck, Thomas G. Ference 1999-08-10
5923181 Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module Kenneth E. Beilstein, Jr., Claude L. Bertin, Dennis Charles Dubois, Wayne J. Howell, Gordon A. Kelley, Jr. +4 more 1999-07-13
5686843 Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module Kenneth E. Beilstein, Jr., Claude L. Bertin, Dennis Charles Dubois, Wayne J. Howell, Gordon A. Kelley, Jr. +4 more 1997-11-11
5534732 Single twist layout and method for paired line conductors of integrated circuits John K. DeBrosse, Jenifer E. Lary 1996-07-09
5303196 Open bit line memory devices and operational method Hoo D. Sang 1994-04-12
5276641 Hybrid open folded sense amplifier architecture for a memory device Hing Wong 1994-01-04
4801869 Semiconductor defect monitor for diagnosing processing-induced defects 1989-01-31